광소자를 포함한 반도체 소자에 대한 물성과 신뢰성 특성 연구를 바탕으로 Device Modeling 및 Circuit Modeling 영역까지 연구 주제를 확장하여 소자 Level에서 System 영역까지의 반도체 전 영역에 대한 다양한 연구 활동을 하고 있습니다.
Material Characterization
- Oxide dielectric thin films.
- Poly-Si epitaxial film.
- Transparent Conductive Oxide films.
TCAD Device Modeling
- Optical devices (PDs, LDs, MODs, VCSELs, etc).
Computer-Integrated Manufacturing of Devices and ICs
- Modeling and Simulation (TCAD including process, device and circuit simulator, and NNets).
- Statistical and neural network modeling for semiconductor equipments & processes.
- Statistical variation for semiconductor processes, devices & ICs.
- Reliability modeling for semiconductor devices.
- Parametric yield modeling for semiconductor devices and ICs.
Circuit Modeling for IC Integration
- High-speed embadded passives for multichip module.
- TCAD modeling for semiconductor devices & IC module.
