- Interface structures of magnetic thin films
: Study of perpendicular magnetic anisotropy & exchange bias
: Soft & Hard x-ray reflectivity
- Ultra thin gate-oxide layer
: Study of interfacial layer properties on Si
a thickness, roughness, & electron density
- Resonant x-ray scattering
: Magnetic scattering
: Anisotropy of Tensor of x-ray Susceptibility (ATS)
- Micro-diffraction
: Study of local strain effect in Ferro-elastic material
국가
대한민국
소속기관
포항공과대학교 (학교)
연락처
054-279-2757 http://www-ph.postech.ac.kr/~xray
책임자
이기봉 kibong@postech.ac.kr