Ellipsometry measures the change in polarization state of light reflected from the surface of a sample. The measured values are expressed as psi and delta. These values are related to the ratio of Fresnel reflection coefficients, Rp and Rs for p- and s- polarized light, respectively. Because ellipsometry measures the ratio of two values, it can be highly accurate and very reproducible. The ratio is a complex number, thus it contains “phase information, delta, which makes the measurement very sensitive.
For more information in details, please refer our RESEARCH
- Temperature Dependence of the Dielectric Function of Monolayer MoSe2 , Scientific Reports 8, pp. 3173
- Optical Properties of GaFeO3, Science of Advanced Materials 10 (2), pp. 302~307
- Thermal and Electric-Field Annealing Effects on the Optical Properties of PTB7:PC71BM Films for Organic Photovoltaics, Science of Advanced Materials 9 (5), pp. 45~51
- Monitoring of the Binding Between EGFR Protein and EGFR Aptamer Using In-Situ Total Internal Reflection Ellipsometry, Journal of Nanoscience and Nanotechnology,16 (6), pp.6445~6449
- Temperature dependence of the critical points of monolayer MoS2 by ellipsometry, Applied Spectroscopy Reviews, 51 (6), pp.621~635
- Dielectric function and critical points of AlP determined by spectroscopic ellipsometry, Journal of Alloys and Compounds, 587, pp. 361~364
- ICSE8 conference in Barcelona, Spain from May 26 - 31.
- Paper of "Temperature dependence of the dielectric function of monolayer MoS2" is published on Current Applied Physics, vol 19. Congratulation to Le Van Long!
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