For several decades, studying materials microstructure was quite challenging as majority of the research works were theoretical. More importantly, providing direct evidence of the atomic scale evolution of material property was nearly impossible due to the limited analysis tools and techniques. However, with the invention of the new analysis and interpretational techniques, elucidating the correlation between material nanostructure and device characteristics has become crucial for the development of novel materials. Our research focuses on the application of aberration-corrected STEM with emphasis on the unprecedented atomic scale imaging techniques aimed at unraveling and understanding the various material property-dependent device performance.
국가
대한민국
소속기관
포항공과대학교 (학교)
연락처
054-279-2161 http://aefi.postech.ac.kr/
책임자
최시영 youngchoi@postech.ac.kr